XRM 2008

Date

July 21 - 25, 2008

Location

ETH Zurich / Zurich, Switzerland

Organizer

Paul Scherrer Institute (PSI)

Exhibit

• X-ray chart (resolution chart)
• X-ray Fresnel Zone Plate (FZP)
• Transmission type grating / Pin hole
• Multilayer mirrors for extreme ultra-violet used for spectroscoping, image forming and reflection
• SiC membrane , SiN membrane
• Beam splitter for soft x-ray
• Transmission filters for the extreme ultraviolet
  * Joint exhibition with NTT-AT Nanofabrication Corporation

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