Material Analysis
Goods and service are introduced in subcategories.
Surface Analysis
- 0.1mm-pitch Four Point Probe
- Thermal behavior of silicon atoms on a silicon oxide film
- Data processing of depth profile
- GaAs surface cleaning in de-ionized water
- X-ray mask, EB mask, Photo mask
- Micro-sampling technology
- Micro-segregation structure of Co-Cr alloy film
- Observation of n-InGaAsP/InP superlattice structure using a scanning electron microscope(SEM)
- Spiral structure of oxide superconductor thin film surface
- Analysis of surge-protection element
- Precipitate in copper-oxide superconductor crystal
