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Material Analysis


Goods and service are introduced in subcategories.

Surface Analysis

  • 0.1mm-pitch Four Point Probe
  • Thermal behavior of silicon atoms on a silicon oxide film
  • Data processing of depth profile
  • GaAs surface cleaning in de-ionized water
  • X-ray mask, EB mask, Photo mask
  • Micro-sampling technology
  • Micro-segregation structure of Co-Cr alloy film
  • Observation of n-InGaAsP/InP superlattice structure using a scanning electron microscope(SEM)
  • Spiral structure of oxide superconductor thin film surface
  • Analysis of surge-protection element
  • Precipitate in copper-oxide superconductor crystal

Standard Samples


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