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GaN Epitaxial Wafer

The Gate to the Future Semiconductor World

Features

NTT-AT provides GaN epitaxial wafers with high mobility for electronic devics
  • GaN epitaxial wafers using various substrates (Sapphire, Si,SiC, GaN)
  • Able to provide large size substrate (up-to 6 inch with Si substrate)
  • Widely accepted by the electronic device market
  • Novel fabrication technique based on the cutting-edge techniques of NTT Laboratories

HEMT Epi Layer Structure image


Lineup

Epi Size Substrate
AlGaN/GaN HEMT epi 2 - 6 inch Sapphireh
2 - 6 inch Si
2 - 4 inch SiC
2 inch GaN


Application

  • Power switching device for power amplifier and inverter (power circuit) for portable base station, etc.
  • MMIC devices, etc. for high frequency devices
  • Voltage conversion devices which can be operated under high-temeprature environment with low power consumption voltage
  • Able to achieve energy saving and protable size electrical devices, etc.


Specifications

AFM Image of HEMT Epi Surface

image1

C-V Profile in AlGaN/GaN HEMT Structure

graph image

Sheet Resistance Uniformity in AlGaN/GaN HEMT

[data]Number of points:28, Average measurement:408.7 ohm/sq., Max. value:414.4ohm/sq., Min. value:403.0ohm/sq., Variation in measurement:2.789%, Std. dev. from average:2.89ohm/sq.

Standard fabrication process

  1. Formulate crystal growth conditions
  2. Substrate cleaning
  3. Expitaxial growth
  4. Non destructive inspection of crystal quality by X-ray diffraction

Other optional inspection services are available to meet your needs

  • Thickness uniformity
  • Composition uniformity
  • Sheet resistance
  • Mobility
  • AFM
  • Surface inspection

NTT-AT is pleased to "customize" our GaN epi-wafer according to your needs.
Please let us know your required layer structure and quantity.



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