X-ray grating
NTT-AT's high-contrast and high-sharpness X-ray gratings are optimized for x-ray Talbot imaging.
Feautures
-Low side-wall roughness
-High edge sharpness
-High contrast X-ray imaging
Specification
| Absorption Grating | Phase Grating | |
|---|---|---|
| Material | Au | Si |
| Membrane | Si, 50 μm thinck | Si, 50 μm thinck |
| Pitch/Height | 3 μm / 10 μm | 2 μm / 20 μm |
| Max. area | 10 mm sq. | 40 mm sq. |
| Customized are available | ||
Papers ＆Publications
Past record
Paper lists
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Jumpei Yamada ,Takato Inoue, Nami Nakamura, Takashi Kameshima, Kazuto Yamauchi, Satoshi Matsuyama and Makina Yabashi,"X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors"
https://www.mdpi.com/1424-8220/20/24/7356/html
