Home > Analysis-related products > Analysis-related products > Standard sample lineup for analytical instruments > Standard sample for in-depth profiling

Standard sample for in-depth profiling

Contact us

It is a multilayer film standard sample used for depth direction resolution evaluation, distance measurement, and sensitivity evaluation such as SIMS, AES, XPS, and XRF analysis.
We will provide a standard sample of your desired material combination, film thickness, and number of layers.

Production example

Si/BN multilayer film sample

  • This is a laminated film sample used for depth direction analysis such as SIMS analysis.
  • In addition to periodic multi-layer film samples, we also support non-periodic multi-layer film samples.
  • It is also possible to form an ultra-thin BN layer (~0.01 nm).
Example of cross-sectional structure evaluation by TEM
Example of cross-sectional structure evaluation by TEM
Si/BN multilayer structure schematic diagram
Si/BN multilayer structure schematic diagram
Example of SIMS depth profile analysis
Example of SIMS depth profile analysis
Example of surface roughness measurement by AFM
Example of surface roughness measurement by AFM

Si/Mo multilayer film sample

Si/Mo multilayer film sample
Si/Mo multilayer film sample
Schematic diagram of Si/Mo multilayer structure
Schematic diagram of Si/Mo multilayer structure
AES measurement
AES measurement
AES analysis evaluation example
AES analysis evaluation example

Various laminated samples

  • We can handle laminated films of various materials.
  • The figure below is an example of a sample in which four different types of materials are laminated.
Cross-sectional structure evaluation example and schematic diagram by TEM
Cross-sectional structure evaluation example and schematic diagram by TEM

Cross-sectional structure evaluation example and schematic diagram by TEM

 

Product Line

close up

Service list

close up

List of proposals for problem solving

close up

Catalog list

close up