The 82nd Annual Meeting of the Japanese Society of Microscopy

This year at the 82nd Annual Meeting of the Japanese Society of Microscopy NTT-AT will showcase 'Length measuring scale','X-ray chart','Standard sample for in-depth profiling'.
We look forward to seeing you in  the 82nd Annual Meeting of the Japanese Society of Microscopy.
Please stop by our booth.

• Length measuring scale
  Ideal for length and angle calibration of scanning probe microscopes, etc. essential for fine pattern evaluation.
• X-ray chart
  We provide resolution test charts for X-ray microscopes.
• Standard sample for in-depth profiling
  It is a multilayer film standard sample used for depth direction resolution evaluation, distance measurement, and sensitivity evaluation such as SIMS, AES, XPS, and XRF analysis.
  We will provide a standard sample of your desired material combination, film thickness, and number of layers.